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X-ray techniques for characterization of cobalt-rich oceanic crusts
Type de document
Publication
Date de publication
2000-09
Langue(s)
Français
Doc(s) complet(s)
http://archimer.ifremer.fr/doc/00000/10415/9517.pdf (Version officielle éditeur, 0.58 Mo)
Copyright:
2000 EDP Sciences
Auteur(s)
Etoubleau Joel, Bohn Marcel, Fouquet Yves, Cambon Pierre, Le Suave Raymond
Affiliation(s):
IFREMER, Dept Geosci Marines, F-29280 Plouzane, France.
CNRS, UMR 6538, F-29280 Plouzane, France.
CNRS, UMR 6538, F-29280 Plouzane, France.
Source:
Journal De Physique Iv (1155-4339) (E D P Sciences), 2000-09 , Vol. 10 , N. P10 , P. 363-374
WOS© Times Cited
3
Thème(s)
Géologie
Abstract
A range of X-ray analytical techniques contributes particularly well to the mineralogical and geochemical characterisations of cobalt-rich iron and manganese oxides crusts. X-ray diffraction is used to identify the weak crystallinity of the material. Bulk geochemical characterisation of the crusts is done by X-ray fluorescence for the precise determination of ca. thirty major and trace elements. Fine scale analysis is carried out by electron microprobe to quantitatively map the distribution of elements in oxide phases within the crusts. Microprobe work is essential to obtain the chemical composition of the embedded metallic micro-meteorites.
Comment citer ce document:
Etoubleau Joel, Bohn Marcel, Fouquet Yves, Cambon Pierre, Le Suave Raymond (2000). Apport des techniques par rayons X à la caractérisation des encroûtements cobaitifères océaniques. Journal De Physique Iv, 10(P10), 363-374. Publisher's official version : http://dx.doi.org/10.1051/jp4:20001039 , Open Access version : http://archimer.ifremer.fr/doc/00000/10415/
Etoubleau Joel, Bohn Marcel, Fouquet Yves, Cambon Pierre, Le Suave Raymond (2000). Apport des techniques par rayons X à la caractérisation des encroûtements cobaitifères océaniques. Journal De Physique Iv, 10(P10), 363-374. Publisher's official version : http://dx.doi.org/10.1051/jp4:20001039 , Open Access version : http://archimer.ifremer.fr/doc/00000/10415/
