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Archimer
Publication Type
Publication
Publication date
1977
Language
English
Full Text
Copyright:
Heyden & Son Ltd
Author(s)
Bougault Henri, Cambon Pierre, Toulhoat H.
Source:
Journal title unknown (Heyden & Son Ltd), 1977 , P. 181-187
Subject(s)
Chemistry, Geology
Mot-Clé(s)
Histoire Ifremer
Abstract
Investigating trace element determination in rocks and taking into account possible instrumental interferences,it is shown that the general relationship between I (net peak intensity) and c (fluorescent element concentration) is (I - Io)M = Ac + B where M is the matrix effect correction factor and A is a constant proportional to the efficiency of excitation; B and Io correspond to the intensities due to, respectively , the scattering (especially, by the sample) of any instrumental interfering radiation, and a possible stray emisision by the instrument itself.Using this equation under optimized conditions allows interferences as high as 200 ppm (if expressed in equivalent concentration) to be compensated without any significant decrease regarding the general accuracy of determinations. [NOT CONTROLLED OCR]
How to cite this document:
Bougault Henri, Cambon Pierre, Toulhoat H. (1977). X-Ray Spectrometric Analysis of Trace Elements in Rocks.Correction for Instrumental Interferences. Journal title unknown, 181-187. Open Access version : http://archimer.ifremer.fr/doc/00000/5179/
Bougault Henri, Cambon Pierre, Toulhoat H. (1977). X-Ray Spectrometric Analysis of Trace Elements in Rocks.Correction for Instrumental Interferences. Journal title unknown, 181-187. Open Access version : http://archimer.ifremer.fr/doc/00000/5179/
