FN Archimer Export Format
PT J
TI Analytical Techniques for the Doppler Signature of Sea Surfaces in the Microwave Regime-II: Nonlinear Surfaces
BT 
AF NOUGUIER, Frederic
   GUERIN, Charles-Antoine
   SORIANO, Gabriel
AS 1:1;2:3;3:2;
FF 1:PDG-ODE-LOS;2:;3:;
C1 IFREMER, Lab Oceanog Spatiale, F-29280 Plouzane, France.
   Univ Aix Marseille 3, Inst Fresnel, Ctr Natl Rech Sci, Unite Mixte Rech 6133, F-13013 Marseille, France.
   Univ Sud Toulon Var, Lab Sondages Electromagnet Environm Terr, Geosci & Remote Sensing Dept, Ctr Natl Rech Sci,Unite Mixte Rech 6017, F-83957 La Garde, France.
C2 IFREMER, FRANCE
   UNIV AIX MARSEILLE, FRANCE
   UNIV TOULON, FRANCE
SI BREST
SE PDG-ODE-LOS
IN WOS Ifremer jusqu'en 2018
   copubli-france
   copubli-univ-france
IF 2.895
TC 35
UR https://archimer.ifremer.fr/doc/00054/16555/14380.pdf
LA English
DT Article
DE ;Doppler spectrum;microwave;nonlinear gravity waves;remote sensing;rough surfaces;scattering;sea surface
AB This paper extends the results of a previous work by combining hydrodynamic and electromagnetic analytical models for the simulation of the ocean Doppler spectrum at microwave frequencies. We consider weakly nonlinear sea surfaces after the choppy wave model and incorporate them in classical and unified scattering models, namely, the Kirchhoff and weighted curvature approximations. We show that statistical expressions can be obtained for the Doppler spectrum in a way similar to the case of linear surfaces. As expected, the nonlinear nature of the sea surface dramatically impacts the Doppler spectrum at moderate to large incidence angles, with a shift of the central frequency and a broadening of the spectrum. Monte Carlo comparisons are performed with the Creamer model, which is frequently used to describe weakly nonlinear sea surfaces but does not enjoy a statistical formulation for the Doppler characteristics. The same qualitative behavior is found but some quantitative differences are found and discussed.
PY 2011
PD DEC
SO Ieee Transactions On Geoscience And Remote Sensing
SN 0196-2892
PU Ieee-inst Electrical Electronics Engineers Inc
VL 49
IS 12
UT 000297281500023
BP 4920
EP 4927
DI 10.1109/TGRS.2011.2153207
ID 16555
ER

EF