Multiscale seismic attributes: source-corrected wavelet response and application to high-resolution seismic data

Type Article
Date 2012-09
Language English
Author(s) Ker StephanORCID1, 2, Le Gonidec Yves3, Gibert Dominique2
Affiliation(s) 1 : IFREMER, Ctr Brest, Dept Geosci Marines, F-29280 Plouzane, France.
2 : Inst Phys Globe Paris CNRS UMR 7154, F-75238 Paris, France.
3 : Univ Rennes 1, Geosci Rennes CNRS UMR 6118, F-35042 Rennes, France.
Source Geophysical Journal International (0956-540X) (Wiley-blackwell), 2012-09 , Vol. 190 , N. 3 , P. 1746-1760
DOI 10.1111/j.1365-246X.2012.05601.x
WOS© Times Cited 10
Keyword(s) Wavelet transform, Wave propagation, Acoustic properties
Abstract A wavelet-based method was presented in a previous work to introduce multiscale seismic attributes for high-resolution seismic data. Because of the limited frequency bandwidth of the seismic source, we observed distortions in the seismic attributes based on the wavelet response of the subsurface discontinuities (Le Gonidec et al.). In this paper, we go further in the seismic source-correction by considering L´evy alpha-stable distributions introduced in the formalism of the continuous wavelet transform (CWT). The wavelets are Gaussian derivative functions (GDF), characterized by a derivative order. We show that a high-resolution seismic source, after a classical signature processing, can be taken into account with a GDF. We demonstrate that in the framework of the Born approximation, the CWT of a seismic trace involving such a finite frequency bandwidth can be made equivalent to the CWT of the impulse response of the subsurface and is defined for a reduced range of dilations.We apply the method for the SYSIF seismic device (Marsset et al.; Ker et al.) and show that the source-corrections allow to define seismic attributes for layer thicknesses in the range [24; 115 cm]. We present the analysis for two seismic reflectors identified on a SYSIF profile, and we show that the source-corrected multiscale analysis quantifies their complex geometries.
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